- Instrument Introduction
Nonlinear optics is one of the fundamental pillars of information optoelectronics and the physics of photonic devices. Understanding second- and third-order nonlinear optical phenomena in crystals and polymers, as well as discovering new phenomena, principles, and methods, provides the basis for developing new materials and devices; it also offers the means to advance new processes, methods, and technologies for device fabrication. The XGX-1 Optical Nonlinearity Measurement System features an innovative design, reasonable pricing, and comprehensive functionality, making it fully suitable for teaching and research needs at universities and research institutions.
- Product Features
· Utilizes laser Z-scan technology
· Simple optical path (single-beam configuration), high measurement sensitivity, and direct measurement of open-hole, closed-hole, and spot information, while simultaneously measuring the nonlinear refractive index and nonlinear absorption coefficient
· Multiple detectors for measuring optical signals (photomultiplier tubes, silicon photodiodes, CCDs)
· Utilizes a computer (Windows multi-screen interface) for automatic control and testing
· Equipped with various accessories suitable for measuring solid samples; USB interface