- Instrument Introduction
The principle of ellipsometric measurement was proposed long ago, and corresponding testing methods and equipment have been continuously improved and innovated, making ellipsometry an important testing technique widely applied in various fields such as optics, materials science, biology, and medicine. Among these applications, measuring the thickness, refractive index, and extinction coefficient of thin-film materials is one of the fundamental and most important uses of ellipsometry.
- Product Features
· The instrument employs an extinction-type circular polarization measurement method
· High precision and automatic control
· Utilizes a helium-neon laser as the light source, ensuring high wavelength accuracy
· Connects to a computer via a USB interface
· The accompanying software offers multiple data processing options to meet various needs
· The software is available in both a full version and a student version, suitable for educational requirements
- Experimental Content
1. Measurement of Young's Modulus