- Instrument Introduction
With the increasing research and application of various thin films across many fields of modern science and technology, the measurement of thin film thickness and optical parameters has become increasingly urgent and important. In practical applications, the circular polarization method is frequently used for measurement. This method offers high sensitivity and accuracy, and is non-destructive. It can simultaneously determine both the thickness and refractive index of a thin film.
This product is a manually adjustable instrument designed to measure film thickness and optical parameters. It clearly illustrates the structure and functions of each component of the ellipsometer, as well as the adjustment methods, enabling users to gain a detailed understanding of the instrument’s principles and structure while developing their practical operational skills.