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Case / More Files
2017 - 08 - 04
Number of clicks: 4566
Manual HydraulicPressure range: 0-15 tonsNo oil leakage, no pressure dropCompatible with high-purity KBr and agate mortar
2017 - 12 - 27
Number of clicks: 2138
Diameter φ13mm, non-removable mold, with matching insert plate
2017 - 08 - 04
Number of clicks: 2601
For testing samples such as plastics and rubber (including silicon wafers)
2017 - 07 - 26
Number of clicks: 2332
KBr window plates, with optical path lengths of 50 mm and 100 mm available
2017 - 07 - 26
Number of clicks: 2602
KBr window, wavelength range 7000–400 cm⁻¹ Spacer optionalOther window film materials are also available.
2017 - 12 - 27
Number of clicks: 1692
KBr window plates, wavelength range 7000–400 cm⁻¹, available in thicknesses of 0.1, 0.25, and 0.5 mm.
2017 - 12 - 27
Number of clicks: 574
10mm x 10mm with cover10mm×10mm airtight with coverWavelength 70002000 cm⁻¹
Contact

Sales Hotline:400-105-3560

After-sales service: 022-83712229 (for physics teaching)

                 022-83726281 (Chemical Analysis)

Tianjin, China

Contact Address:2nd Floor, EF Unit, Building G, Xinmao Technology Park, Huayuan Industrial Park, Tianjin

Description: Similar to the halide pellet pressing method, the diffuse reflectance method alsorequires mixing powder samples with diluent. The differenceis that the diffuse reflectance method directly analyzes the original stateof the sample without the need for pellet pressing, making it suitablefor dynamic in-situ testing of fine particles and powdered samplesSuitable for FTIR-850
Date: 2017 - 12 - 27
click count: 239
Description: Monitoring of chemical reaction processesAnalysis of components in petroleum, pharmaceutical, and food processesExhaust duct and petroleum gas monitoringSuitable for FTIR-850
Date: 2017 - 12 - 27
click count: 234
Description: Used for the determination of hydroxyl content in tubular quartz glass
Date: 2017 - 12 - 27
click count: 192
Description: Used for the determination of oxygen and carbon content in monocrystalline silicon (including standard reference silicon wafers)
Date: 2017 - 12 - 27
click count: 170
Description: Optimized determination for solid samples, powder samples, and high-concentration samples
Date: 2017 - 12 - 28
click count: 1518
Description: No need to open the cover to replace samples, enabling rapid measurement of multiple samples
Date: 2017 - 12 - 28
click count: 480

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Address: 2nd Floor, EF Unit, Building G, Xinmao Technology Park, Huayuan Industrial Park, Tianjin, China    Tel: 86 022-83713560   Email: sales@tjgd.com

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